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Model-Based Parametric Study of Surface-Breaking Defect Characterization Using Half-Skip Total Focusing Method
Department of Industrial and Materials Science (IMS), Chalmers University of Technology, Gothenburg (SWE).ORCID-id: 0000-0003-1181-9014
Högskolan Väst, Institutionen för ingenjörsvetenskap, Avdelningen för avverkande och additativa tillverkningsprocesser (AAT). (KAMPT)ORCID-id: 0000-0002-4274-1144
Division of Signals and Systems, Luleå University of Technology, 97187, Luleå (SWE).
2023 (Engelska)Ingår i: Journal of nondestructive evaluation, ISSN 0195-9298, E-ISSN 1573-4862, Vol. 42, nr 2, s. 1-12Artikel i tidskrift (Refereegranskat) Published
Abstract [en]

As the demand of structural integrity in manufacturing industries is increasing, the ultrasonic array technique has drawn more attention thanks to its inspection flexibility and versatility. By taking advantage of the possibility of individual triggering of each array element, full matrix capture (FMC) data acquisition strategy has been developed that contains the entire information of an inspection scenario. Total focusing method (TFM) as one of the ultrasonic imaging algorithms, is preferably applied to FMC dataset since it uses all information in FMC to synthetically focus the sound energy at every image pixel in the region of interest. Half-skip TFM (HSTFM) is proposed in multi-mode TFM imaging that involves a backwall reflection wave path, so that the defect profile could be reconstructed for accurate defect characterization. In this paper, a method involving Snell’s law-based wave mode conversion is proposed to account for more reasonable wave propagation time when wave mode conversion happens at backwall reflection in HSTFM. A series of model based simulations (in software simSUNDT) are performed for parametric studies, with the intention of investigating the capability of defect characterization using HSTFM with varying tilt angle and relative position of surface-breaking notch to array probe. The results show that certain TFM modes could help with defect characterization, but the effectiveness is limited with varying defect features. It is inappropriate to address a certain mode for all characterization perspectives but rather a combination, i.e., multi-mode TFM, should be adopted for possible interpretation and characterization of defect features.

Ort, förlag, år, upplaga, sidor
2023. Vol. 42, nr 2, s. 1-12
Nyckelord [en]
Ultrasonic array, Defect characterization, Total focusing method, Simulation, simSUNDT
Nationell ämneskategori
Bearbetnings-, yt- och fogningsteknik
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Produktionsteknik
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URN: urn:nbn:se:hv:diva-19987DOI: 10.1007/s10921-023-00949-7ISI: 000970754800001Scopus ID: 2-s2.0-85153231650OAI: oai:DiVA.org:hv-19987DiVA, id: diva2:1762169
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Tillgänglig från: 2023-06-02 Skapad: 2023-06-02 Senast uppdaterad: 2025-09-30Bibliografiskt granskad

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Wirdelius, Håkan

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