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Characterization of multilayer nitride coatings by electron microscopy and modulus mapping
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2013 (English)In: Materials Characterization, Vol. 81, 7-18 p.Article in journal (Refereed) Published
Abstract [en]

This paper discusses multi-scale characterization of physical vapour deposited multilayer nitride coatings using a combination of electron microscopy and modulus mapping. Multilayer coatings with a triple layer structure based on TiAlN and nanocomposite nitrides with a nano-multilayered architecture were deposited by Cathodic arc deposition and detailed microstructural studies were carried out employing Energy Dispersive Spectroscopy, Electron Backscattered Diffraction, Focused Ion Beam and Cross sectional Transmission Electron Microscopy in order to identify the different phases and to study microstructural features of the various layers formed as a result of the deposition process. Modulus mapping was also performed to study the effect of varying composition on the moduli of the nano-multilayers within the triple layer coating by using a Scanning Probe Microscopy based technique. To the best of our knowledge, this is the first attempt on modulus mapping of cathodic arc deposited nitride multilayer coatings. This work demonstrates the application of Scanning Probe Microscopy based modulus mapping and electron microscopy for the study of coating properties and their relation to composition and microstructure. © 2013 Elsevier Inc.

Place, publisher, year, edition, pages
2013. Vol. 81, 7-18 p.
Keyword [en]
Cross sectional Transmission, Electron Backscattered Diffraction (EBSD), Electron Microscopy (XTEM), Focused Ion Beam (FIB), Modulus mapping, Multilayer coatings, Cathodic arc deposition, Cross sectional transmission electron microscopy, Electron back-scattered diffraction, Microstructural features, Multi-layer-coating, Nitride multilayer coatings, Triple-layer structures, Coatings, Deposits, Electron diffraction, Energy dispersive spectroscopy, Focused ion beams, Mapping, Microstructural evolution, Nitrides, Scanning probe microscopy, Transmission electron microscopy, Multilayers
URN: urn:nbn:se:hv:diva-8483ISBN: 10445803 (ISSN)OAI: diva2:859911
Available from: 2015-10-09 Created: 2015-10-08 Last updated: 2015-10-09Bibliographically approved

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Joshi, S. V.

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