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Multifrequency Test and Diagnosis of Analog Circuits Using Constraint Programming and Interval Arithmetic
Lunds universitet, Lund, Sverige.ORCID iD: 0000-0002-1748-8837
Lunds universitet, Lund, Sverige.
2003 (English)Conference paper, Poster (with or without abstract) (Other academic)
Abstract [en]

Analog circuits are often specified using non-linear equations, which are difficult to analyze. Therefore, test generation and diagnosis are problematic issues in practice. In this paper we propose a new method for diagnosis of analog circuits that uses combined information from tests at different frequencies. By solving simultaneously the resulting equations (one for each test frequency), we get a reliable method that decreases the number of possible answers to the diagnosis problem. The min-max optimization algorithm that we implemented for non-linear transfer functions gives good average runtime for diagnosis parametric faults.

Place, publisher, year, edition, pages
PoznaƱ, Poland, 2003.
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:hv:diva-13892OAI: oai:DiVA.org:hv-13892DiVA, id: diva2:1318699
Conference
DDECS. 2003
Available from: 2019-05-28 Created: 2019-05-28 Last updated: 2019-06-13Bibliographically approved

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Other links

http://ddecs03.put.poznan.pl/

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Fuentes Martinez, Ana

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