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Analysis of residual stresses resulting from the surface preparation for X-ray diffraction measurement
Federal University of Uberlandia (UFU),Laprosolda-Center for Research and Development of Welding Processes, Uberlândia, Brazil.
Brazilian Nanotechnology National Laboratory (LNNano), Brazilian Center for Research in Energy and Materials (CNPEM), Campinas, Brazil.
Brazilian Nanotechnology National Laboratory (LNNano), Brazilian Center for Research in Energy and Materials (CNPEM), Campinas, Brazil.
University West, Department of Engineering Science, Division of Welding Technology. Federal University of Uberlandia (UFU),Laprosolda-Center for Research and Development of Welding Processes, Uberlândia, Brazil. (PTW)ORCID iD: 0000-0002-1005-5895
2018 (English)In: Journal of the Brazilian Society of Mechanical Sciences and Engineering, ISSN 1678-5878, E-ISSN 1806-3691, Vol. 40, no 2, article id 94Article in journal (Refereed) Published
Abstract [en]

There is no consensus in the literature on the need to remove preprocessing layers from the material prior to the measurement of residual stresses by X-ray diffractometer. Thus, the purpose of this work was to evaluate the residual stresses induced by material preprocessing and its evolution during the preparation of the surface by electrolytic removal. Sample surfaces were pre-processed by grinding and sandblasting and the resulting residual stresses were measured by X-ray diffractometry. At each removal stage, the evolution of residual stresses, hardness and microstructure of the surface were verified. It was concluded that different preprocessing methods can induce surface residual stresses of either tension or compression, reaching different depths. Removal by electrolytic method of the modified layer has shown itself capable of reducing significantly the magnitude of the residual stresses induced by preprocessing. On the other hand, the depth of deformed grains or surface hardness proved to be incapable of predicting the depth of induced residual stresses. Finally, it was discussed whether or not the layers removed by this method reveal the subsurface stresses and if the removal should take place before or after a second processing.

Place, publisher, year, edition, pages
2018. Vol. 40, no 2, article id 94
Keywords [en]
Residual stress, X-ray diffraction, Preprocessing, Surface stresses, Electrolytic removal
National Category
Manufacturing, Surface and Joining Technology
Research subject
ENGINEERING, Manufacturing and materials engineering; Production Technology
Identifiers
URN: urn:nbn:se:hv:diva-12055DOI: 10.1007/s40430-018-1036-5ISI: 000424641000042PubMedID: 2-s2.0-85041305145OAI: oai:DiVA.org:hv-12055DiVA, id: diva2:1181065
Note

First Online: 29 January 2018

Available from: 2018-02-07 Created: 2018-02-07 Last updated: 2018-03-01Bibliographically approved

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Scotti, Americo

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