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Analysis of residual stresses resulting from the surface preparation for X-ray diffraction measurement
Federal University of Uberlandia (UFU),Laprosolda-Center for Research and Development of Welding Processes, Uberlândia, Brazil.
Brazilian Nanotechnology National Laboratory (LNNano), Brazilian Center for Research in Energy and Materials (CNPEM), Campinas, Brazil.
Brazilian Nanotechnology National Laboratory (LNNano), Brazilian Center for Research in Energy and Materials (CNPEM), Campinas, Brazil.
Högskolan Väst, Institutionen för ingenjörsvetenskap, Avdelningen för svetsteknologi (SV). Federal University of Uberlandia (UFU),Laprosolda-Center for Research and Development of Welding Processes, Uberlândia, Brazil. (PTW)ORCID-id: 0000-0002-1005-5895
2018 (engelsk)Inngår i: Journal of the Brazilian Society of Mechanical Sciences and Engineering, ISSN 1678-5878, E-ISSN 1806-3691, Vol. 40, nr 2, artikkel-id 94Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

There is no consensus in the literature on the need to remove preprocessing layers from the material prior to the measurement of residual stresses by X-ray diffractometer. Thus, the purpose of this work was to evaluate the residual stresses induced by material preprocessing and its evolution during the preparation of the surface by electrolytic removal. Sample surfaces were pre-processed by grinding and sandblasting and the resulting residual stresses were measured by X-ray diffractometry. At each removal stage, the evolution of residual stresses, hardness and microstructure of the surface were verified. It was concluded that different preprocessing methods can induce surface residual stresses of either tension or compression, reaching different depths. Removal by electrolytic method of the modified layer has shown itself capable of reducing significantly the magnitude of the residual stresses induced by preprocessing. On the other hand, the depth of deformed grains or surface hardness proved to be incapable of predicting the depth of induced residual stresses. Finally, it was discussed whether or not the layers removed by this method reveal the subsurface stresses and if the removal should take place before or after a second processing.

sted, utgiver, år, opplag, sider
2018. Vol. 40, nr 2, artikkel-id 94
Emneord [en]
Residual stress, X-ray diffraction, Preprocessing, Surface stresses, Electrolytic removal
HSV kategori
Forskningsprogram
TEKNIK, Produktions- och materialteknik; Produktionsteknik
Identifikatorer
URN: urn:nbn:se:hv:diva-12055DOI: 10.1007/s40430-018-1036-5ISI: 000424641000042PubMedID: 2-s2.0-85041305145Scopus ID: 2-s2.0-85041305145OAI: oai:DiVA.org:hv-12055DiVA, id: diva2:1181065
Merknad

First Online: 29 January 2018

Funders: Brazilian National Council for Scientific and Technological Development (CNPq), 302863/2016-8 and 149308/2014-0; Minas Gerais State Agency for Research and Development (FAPEMIG), TEC—APQ-01992-15.

Tilgjengelig fra: 2018-02-07 Laget: 2018-02-07 Sist oppdatert: 2019-03-06bibliografisk kontrollert

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