Open this publication in new window or tab >>2003 (English)Conference paper, Poster (with or without abstract) (Other academic)
Abstract [en]
Analog circuits are often specified using non-linear equations, which are difficult to analyze. Therefore, test generation and diagnosis are problematic issues in practice. In this paper we propose a new method for diagnosis of analog circuits that uses combined information from tests at different frequencies. By solving simultaneously the resulting equations (one for each test frequency), we get a reliable method that decreases the number of possible answers to the diagnosis problem. The min-max optimization algorithm that we implemented for non-linear transfer functions gives good average runtime for diagnosis parametric faults.
Place, publisher, year, edition, pages
Poznañ, Poland: , 2003
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:hv:diva-13892 (URN)
Conference
DDECS. 2003
2019-05-282019-05-282019-06-13Bibliographically approved